CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test

By: PAVLOV, ANDREIMaterial type: Text

TextLanguage: English Publication details: USA Springer Description: XVI, 193 p. CD4742ISBN: 978-81-322-0232-5 (PB)Subject(s): CMOS SRAM circuit designDDC classification: 621.38152 Action note: Good condition

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Department of Computer System Engineering Library	621.38152 PAV (Browse shelf(Opens below))	Available		CS-4742

May 18 2018 12:00AM:19134,999(Pak Book Corporation) Good condition

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